PID

April 26, 2024
Yield Loss

PID yield loss countered by path-based antenna verification

Plasma induced damage (PID) in gate oxide is a threat to MOSFET circuit yield and reliability. How can you effectively combat this issue?
Article  |  Topics: Uncategorized  |  Tags: , , , ,   |  Organizations:

PLATINUM SPONSORS

Synopsys Cadence Design Systems Siemens EDA
View All Sponsors