EDA

September 12, 2012

Critical tools for 20nm design

A look at the way in which key tools, in IC implementation, modeling and extraction, and physical verification, are developing in response to the challenges of 20nm design
September 6, 2012
Antun Domic

Getting ready for 20nm

Antun Domic of Synopsys tackles the three key challenges of 20nm processes: design complexity; the physics of lithography; and economics.
Expert Insight  |  Topics: EDA - DFM  |  Tags: , ,   |  Organizations:
August 23, 2012
Pranav Ashar

Verification challenges require surgical precision

The verification challenge is best addressed by a combination of highly targeted tools, according to Pranav Ashar, CTO of Real Intent.
Expert Insight  |  Topics: EDA - Verification  |  Tags: , , , ,   |  Organizations:
August 18, 2012

When good DFT goes bad: debugging broken scan chains

Scan chains help you test complex chip designs. But how do you test the scan chains themselves when they go wrong?
Article  |  Topics: EDA - DFT  |  Tags: , , , ,   |  Organizations:
July 26, 2012
Cloud image

Optimizing cloud computing for faster semiconductor design

How Cadence, Intel and Xuropa accelerated the semiconductor design process by squeezing 15% more capacity out of a virtualized server farm
July 26, 2012

Synthesizing assertions into hardware for faster silicon debug

Assertions are already used in pre-silicon verification and can help halve debug time. So why not synthesize assertions into real logic gates in the final silicon, to catch those unexpected bugs that make validation so much harder? Here’s how.
Article  |  Topics: EDA - Verification  |  Tags: , ,   |  Organizations:
July 5, 2012

Improving ASIC prototyping on multiple FPGAs through better partitioning

Using a new design-partitioning tool and stacked-silicon interconnect FPGA to develop an ASIC prototyping platform that can be reprogrammed several times a day.
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July 3, 2012
Juergen Schloeffel

Why cell-aware testing is important

Characterizing standard-cell defect mechanisms helps improve IC testing
Expert Insight  |  Topics: EDA - DFT  |  Tags: , , ,   |  Organizations:
June 1, 2012
Michael Buehler-Garcia

DAC 2012: 20(nm) questions

There's still debate over certain aspects of the 20nm node, but the main challenges are already being addressed. Expect to see foundries and vendors mark their turf at DAC.
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May 22, 2012
Jeff Wilson

Making dummy fill smarter

Guest blogger Jeff Wilson discusses some of the subtleties involved in the effective use of dummy fill in deep sub-micron IC designs.
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