Volume 5

March 1, 2008

Parasitics: an old problem reaches new heights

The semiconductor industry faces increasing challenges in the design of complex systems-on-chip, and while some have sprung from new, only recently anticipated sources, others are, in fact, very familiar. Foremost among these are the interconnect delays caused by the increasing influence of parasitic networks. Parasitic inductance is also a growing concern. The causes of parasitic […]

Article  |  Tags:
March 1, 2008

How VHDL designers can exploit SystemVerilog

SystemVerilog, the standard that originated from Accellera and is now IEEE1800, is not just for Verilog users. VHDL users can also improve their design processes using its proven verification features. Anyone involved in systemon- chip (SoC) design may face a mixed-language environment and will appreciate being able to leverage SystemVerilog with the VHDL portions of […]

Article  |  Tags: , ,
March 1, 2008

High quality scan test with minimal pins

Changes in defect distribution, increasing design complexity and pressures from the specialist I/O and packaging arenas are creating a dilemma during component test. On the one hand, the generation of more test patterns would appear to be necessary; but on the other, fewer test ports are available. The article describes a strategy for addressing this […]

Article  |  Tags:
March 1, 2008

ESL at the inflection point

Electronic system level (ESL) design is moving to a new stage in its development, advancing from a proof-of-concept environment to one that is seeing its adoption and deployment at the forefront of design. The article terms this shift ‘ESL 2.0’. The reason for this goes beyond mere marketing hype. Inherent in the transition defined above […]

Article  |  Tags:

PLATINUM SPONSORS

Synopsys Cadence Design Systems Siemens EDA
View All Sponsors