Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed the ramp-to-volume on new processes and improve yield on mature ones.
An alphabet soup of AI, HPC, 5G and the IoT has finally seeded creation of a design infrastructure for silicon photonics.
High level synthesis (HLS) was adopted to realize innovative display IP as developed by a small core engineering team.
Pattern-based design/technology co-optimization (DTCO) estimates lithographic difficulty during the early stages of a new process technology node.
MCMM analysis is a technique intended to provide high-confidence results for timing closure and other metrics without performing exhaustive simulation of all possible IC conditions.More MCMM
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