power gating

X propagation within RTL simulations can hide fatal bugs. Uncovering and eliminating the effect improves design quality and avoids respins.

IEEE 1801-2013 updates and refines the Unified Power Format for low-power VLSI design, reflecting changes in power modeling and verification.

The IEEE Unified Power Format (UPF) standard is intended to support low-power designs that use switchable power states and power islands.