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May 29, 2015
Smaller designs face greater risk of respins
Research study suggests the maturity of your verification flow determines the likelihood of first-pass success far more than the complexity inherent in design size.
Article | Topics:
EDA - Verification
| Tags:
assertions
,
code coverage
,
constrained random verification (CRV)
,
first pass silicon
,
functional coverage
,
functional verification
,
research
,
respin
| Organizations:
Mentor Graphics
,
Wilson Research Group
EDA Topics
DFM
DFT
ESL
IC Implementation
Verification
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