Wilson Research Group

May 29, 2015

Smaller designs face greater risk of respins

Research study suggests the maturity of your verification flow determines the likelihood of first-pass success far more than the complexity inherent in design size.

Article | Topics: EDA - Verification | Tags: assertions, code coverage, constrained random verification (CRV), first pass silicon, functional coverage, functional verification, research, respin | Organizations: Mentor Graphics, Wilson Research Group

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