ARM

November 5, 2012
20nm test feature image

20nm test demands new design-for-test and diagnostic strategies

20nm test needs new approaches to cope with short delay defects, new memory failure mechanisms and the consequences of test compression strategies
Article  |  Topics: EDA - DFT  |  Tags: , , , ,   |  Organizations: , ,
January 23, 2012
When ARM's 64 title image

When ARM’s 64

There’s already some love out there for ARM’s v8 64bit architecture as the processor giant builds out its ecosystem.
Article  |  Topics: Embedded - Platforms  |  Tags: , ,   |  Organizations:
March 1, 2007

System-level design matures

How do we bridge the gap between the highly abstract view provided by traditional system-level design and the detailed implementation in RTL? The article answers this question by describing the components within an ESL methodology and illustrating its use via customer case studies. The methodology uses the ARM RealView SoC Designer tool and Tenison Design […]

Article  |  Topics: EDA - ESL  |  Tags: ,   |  Organizations:
March 1, 2006

ARM and the man

When microprocessor core developer ARM started in a barn outside Cambridge, England, just over fifteen years ago, odds were against it making a global impact. The team of “12 engineers and me”, as then CEO and now chairman Sir Robin Saxby puts it, “had no patents, a working prototype and £1.75m of cash.” Without the […]

Article  |  Topics: EDA - IC Implementation  |  Tags: , ,   |  Organizations:

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