stuck-at faults

April 10, 2017
Ron Press is a technical marketing director at Mentor - A Siemens Business. He specializes in DFT and BIST and was the 2010 General Chair of the International Test Conference.

Drawing on hierarchical DFT to benefit all designs and flows

Hierarchical DFT is vital for large, complex designs. Users still to transition to the technique can nevertheless exploit its pattern reuse strategies as they move toward adoption.
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