critical feature analysis

May 22, 2012

Effective finger-pointing: the art of modern yield analysis

Correlating production test failure diagnosis with DFM analysis can help identify and understand systematic yield issues, and to find out whether they are linked to DFM violations.
Article  |  Topics: EDA - DFM  |  Tags: , ,   |  Organizations:
May 1, 2010

Using DFM for competitive advantage

The article offers a case study of the DFM planning and methodology applied during a shrink of Cambridge Silicon Radio's UF6000 system-on-chip from the 130nm to 65nm.
Article  |  Topics: EDA - DFM  |  Tags: , , , , , ,   |  Organizations: ,

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