CD

All (1)
Articles (1)

February 14, 2020

A better way to debug P2P results

P2P (point-to-point) resistance is fundamental to IC reliability verification. Handle it more efficiently with detailed, automated path layout analysis.

Article | Topics: EDA - Verification | Tags: Calibre, CD, critical dimension, debug, P2P, point-to-point resistance, reliability, reliability verification | Organizations: Siemens EDA