December 2008

December 1, 2008

Combining yield and performance in behavioral models for analog ICs

The article describes an algorithm that combines performance and variation objectives in a behavioral model for a given analog circuit topology and process. The tradeoffs between performance and yield are analyzed using a multi-objective evolutionary algorithm and Monte Carlo simulation. The results indicate a signi?cant improvement in overall simulation time and ef? ciency compared to […]

Article  |  Tags:
December 1, 2008

OCP performance monitoring with programmable instruments

The process of proving the system is working and performing optimally, under all application and environmental conditions, has become too inefficient and difficult for existing methodologies. Traditional methods for addressing post-silicon requirements have reached the point of diminishing returns. What was once an exercise of designing, implementing and verifying 25,000 to 50,000 gates of instrumentation […]

PLATINUM SPONSORS

Synopsys Cadence Design Systems Siemens EDA
View All Sponsors