Tech Design Forums
Technique
PUF
PUF
All
(2)
Articles
(2)
April 17, 2018
Reliability research helps to create new technologies
Insights from research into reliability at Imec led to self-learning chips, security technologies, and finFET biosensors.
Expert Insight | Topics:
EDA - DFM
| Tags:
biosensor
,
failure analysis
,
finFET
,
IC reliability
,
PUF
,
RRAM
| Organizations:
Imec
October 14, 2017
Making security a profit center for silicon
The assumption has been that extra security eats into profit margins. But with some lateral thinking it can actually improve the bottom line.
Expert Insight | Topics:
IP - Assembly & Integration
,
Design Management
,
EDA - DFT
,
IC Implementation
,
Embedded - Integration & Debug
| Tags:
cloning
,
configuration
,
counterfeiting
,
fingerprinting
,
firmware
,
mask
,
PUF
,
security
,
upgrade
| Organizations:
Siemens EDA
Embedded Topics
Architecture & Design
Integration & Debug
Platforms
User Experience
PLATINUM SPONSORS
View All Sponsors
twitter
facebook
RSS
Tech Design Forum
Log In
Register
Sponsors
Briefing
EDA
EDA TOPICS
DFM
DFT
ESL
IC Implementation
Verification
MORE EDA
Expert Insights
Guides
EDA Home Page
IP
IP TOPICS
Assembly & Integration
Design Management
Selection
MORE IP
Expert Insights
Guides
IP Home Page
PCB
PCB TOPICS
Design Integrity
Layout & Routing
System Codesign
MORE PCB
Expert Insights
Guides
PCB Home Page
Embedded
EMBEDDED TOPICS
Architecture & Design
Integration & Debug
Platforms
User Experience
MORE EMBEDDED
Expert Insights
Guides
Embedded Home Page
Search