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April 17, 2018
Reliability research helps to create new technologies
Insights from research into reliability at Imec led to self-learning chips, security technologies, and finFET biosensors.
Expert Insight | Topics:
EDA - DFM
| Tags:
biosensor
,
failure analysis
,
finFET
,
IC reliability
,
PUF
,
RRAM
| Organizations:
Imec
October 14, 2017
Making security a profit center for silicon
The assumption has been that extra security eats into profit margins. But with some lateral thinking it can actually improve the bottom line.
Expert Insight | Topics:
IP - Assembly & Integration
,
Design Management
,
EDA - DFT
,
IC Implementation
,
Embedded - Integration & Debug
| Tags:
cloning
,
configuration
,
counterfeiting
,
fingerprinting
,
firmware
,
mask
,
PUF
,
security
,
upgrade
| Organizations:
Siemens EDA
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