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diagnostics
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January 27, 2022
Assure diagnostic coverage from RTL to gate level during analysis for functional safety
Generating accurate ASIL metrics early in the functional safety lifecycle, reduces time-to-certification for ISO26262.
Article | Topics:
EDA Topics
,
EDA - IC Implementation
,
Verification
| Tags:
ASIL
,
automotive
,
autonomous vehicles
,
diagnostics
,
functional safety
,
gate-level
,
ISO 26262
,
RTL
| Organizations:
Siemens EDA
November 8, 2016
Best practice in scan pattern ordering for test and diagnosis
How to tune your scan pattern creation and application to cost-effectively match your test objectives.
Article | Topics:
EDA - DFT
| Tags:
data logging
,
diagnostics
,
production test
,
scan pattern
,
UDFM
,
yield ramp
| Organizations:
Mentor Graphics
EDA Topics
DFM
DFT
ESL
IC Implementation
Verification
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