September 2007

Introduction Burgeoning design complexity has greatly increased the scale of the verification effort. At the same time, there is a widening gap between the growth in vital activities such as functional verification and the ability of tools and methodologies to fulfill such tasks efficiently. If we fail to close that gap, the potential impact on […]

Simultaneous Switching Noise (SSN) is the voltage fluctuation caused by the simultaneous switching of groups of output chip I/O drivers that drive high slew rate signals. It has an impact on I/O and core power supply lines and on signal lines, and is an increasingly important challenge for designs that incorporate high performance interfaces, such […]