Tech Design Forums
Technique
12nm
12nm
All
(2)
Articles
(2)
December 31, 2018
Enhanced model-based hinting may be the edge you need below 20nm
A detailed dive into how MBH strategies for litho hotspots have been enhanced to deal with double patterning at 20nm and below.
Article | Topics:
EDA - DFM
| Tags:
10nm
,
12nm
,
20nm
,
double pattering
,
lithography
,
MBH
,
model-based hinting
| Organizations:
GlobalFoundries
,
Samsung Semiconductor
,
Siemens EDA
,
TSMC
,
UMC
October 27, 2017
Catch multi-patterning errors clearly at advanced nodes
How to address increasingly complex patterning issues and debug them efficiently as design moves toward 12 and 10nm.
Article | Topics:
EDA - DFM
,
- EDA Topics
,
EDA - Verification
| Tags:
10nm
,
12nm
,
14nm
,
20nm
,
double patterning
,
lithography
,
multi-patterning
| Organizations:
Siemens EDA
EDA Topics
DFM
DFT
ESL
IC Implementation
Verification
PLATINUM SPONSORS
View All Sponsors
twitter
facebook
RSS
Tech Design Forum
Log In
Register
Sponsors
Briefing
EDA
EDA TOPICS
DFM
DFT
ESL
IC Implementation
Verification
MORE EDA
Expert Insights
Guides
EDA Home Page
IP
IP TOPICS
Assembly & Integration
Design Management
Selection
MORE IP
Expert Insights
Guides
IP Home Page
PCB
PCB TOPICS
Design Integrity
Layout & Routing
System Codesign
MORE PCB
Expert Insights
Guides
PCB Home Page
Embedded
EMBEDDED TOPICS
Architecture & Design
Integration & Debug
Platforms
User Experience
MORE EMBEDDED
Expert Insights
Guides
Embedded Home Page
Search