Siemens EDA

July 25, 2017
Featured Image - Portable Stimulus feature

Automating test from IP to SoC levels with portable stimulus

This introduction to the new Accellera standard includes a demo of portable stimulus in use to fully verify a DMA engine.
Article  |  Topics: EDA - Verification  |  Tags: , , , ,   |  Organizations: ,
June 13, 2017
Emulation save-and-restore debug featured image

Hardware emulation gets smarter with save-and-restore for debug

Techniques previously unavailable during ICE or testbench acceleration can now greatly speed emulation debug in those modes.
Article  |  Topics: EDA - Verification  |  Tags: , , , , ,   |  Organizations: ,
June 13, 2017
Karim Segond

Cooling power electronics at room level

German consultancy E-Cooling describes its strategy for thermal and airflow analysis.
Expert Insight  |  Topics: Thermal design  |  Tags: , , ,   |  Organizations: , ,
May 15, 2017
Dr Walden Rhines is Chairman and CEO of Mentor - A Siemens Business

The Wally Rhines interview – Part Two: AI, automotive and security

This second part looks at Mentor's views on flow neutrality, how DRS360 was born, machine learning and the threat from embedded Trojans.
May 10, 2017
Nest Thermostat for IoT PCB article

The basic PCB rules for a successful IoT design

Seven core considerations will help you realize your PCB for the Internet of Things more effectively.
May 8, 2017
Dr Walden Rhines is Chairman and CEO of Mentor - A Siemens Business

The Wally Rhines interview – Part One: Mentor as a Siemens business

Our extended fireside chat with Mentor Chairman and CEO Wally Rhines begins by canvassing his thoughts now the Siemens deal is done.
April 10, 2017
Ron Press is the technology enablement director of the Tessent product family at Mentor, A Siemens Business. He is a member of the International Test Conference (ITC) Steering Committee, a Golden Core member of the IEEE Computer Society, and a Senior Member of the IEEE.

Drawing on hierarchical DFT to benefit all designs and flows

Hierarchical DFT is vital for large, complex designs. Users still to transition to the technique can nevertheless exploit its pattern reuse strategies as they move toward adoption.
Expert Insight  |  Topics: EDA - DFT  |  Tags: , , ,   |  Organizations: ,

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