Mentor executive, former Design Automation Conference chair and Tech Design Forum journal founder to receive Marie R. Pistilli Award at DAC 2018.
Will discuss how automotive OEMs and chip designers can use AI, deep learning, and convolutional neural networks to achieve better performance than traditional techniques.
Synopsys experts are now blogging about key issues in formal verification - how to use it, which techniques to apply, and the effort/reward ratio of doing so.
Videos discuss formal verification planning, correct initialisation, writing constraints, developing properties, interpreting results - and knowing when you have done enough.
finFETs are vital to the next generation of CMOS processes from Intel, TSMC and others. How will process issues including bulk vs SOI substrates, density limitations, thickness control, and planar device integration affect their practical implementation?
Mentor's Stephen Pateras explains how the proposed IJTAG standard speeds IP test by replacing time-consuming custom and ad hoc methodologies.
The advantages and challenges of 3D IC integration, as we add vertical functional integration options to the traditional planar integration brought by the progress of Moore's Law.
Embedded hardware and software are experiencing exciting advances but free, open source technologies only go so far in connecting them. Help is on the way.
Manufacturability, routing, library design and more - it all needs rethinking at 20nm
Tackling the three key challenges of 20nm processes: design complexity; the physics of lithography; and economics.
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