Assembly & Integration

January 12, 2016
Angela Raucher is product line manager for Synopsys’ ARC EM processors.

Processor configuration for low-power IoT applications

Many IoT applications have a very strict energy budget. SoC designers targeting the IoT have to trade off providing the features that the market demands with the power budget the applications demand. What are their options?
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January 11, 2016
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FPGA design for functional safety

Using triple modular redundancy, error detection and correction, and 'safe' FSMs to ensure greater functional safety in FPGA-based designs
September 18, 2015
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How PHY verification kits overcome traditional VIP limitations

Established physical layer verification IP packages focus so much on protocols they miss problems that arise from the broader context. A PHY verification kit bridges the gap.
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May 6, 2015
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Fixing late ECOs in ARM core subsystems at STMicroelectronics

Using equivalence checking to validate ECOs in ARM core subsystem development at STMicroelectronics
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April 20, 2015
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Developing and integrating configurable GPU IP using FPGA-based prototyping

How Imagination Technologies used FPGA-based prototyping to develop its GPU IP and integrate it into a real world system
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February 27, 2015
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Getting the most out of IP based FPGA design with Synplify

How Synplify makes it easier to use IP in FPGA-based designs, and package your own IP for secure reuse, on Altera and Xilinx devices
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January 7, 2015
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A holistic approach to IoT chip design

A look at the challenges of designing chips for the Internet of Things, or IoT, and some of the responses to those challenges
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November 5, 2014
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How to use pattern matching to improve automatic waiver management

Fab and IP vendor collaboration is making pattern matching-based libraries a vital component of DRC accuracy and efficiency. Learn how to take advantage.
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October 15, 2014
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Accelerating ‘time to prototype’ with ProtoCompiler

A look at a tool and a flow that makes it easier to put designs on to a HAPS physical prototyping system for verification, debug and software development purposes
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October 10, 2014
Dr Yervant Zorian, Synopsys

Finding and fixing faults in finFET memories

FInFET memories have different defects than those based on planar transistors. Here's how to test and repair them.
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