20nm test needs new approaches to cope with short delay defects, new memory failure mechanisms and the consequences of test compression strategies
Scan chains help you test complex chip designs. But how do you test the scan chains themselves when they go wrong?
Making a smooth transition to IJTAG, the scan-test strategy for IP blocks, without having to change your existing hardware.
Characterizing standard-cell defect mechanisms helps improve IC testing
The inherent complexity of today’s system-on-chips, with their multiple clock and voltage domains, requires test considerations to be moved further up design flows. The article describes strategies for and benefits from apply test before RTL goes through synthesis, augmenting what is already achieved through memory built-in self test and automatic test pattern generation.
This article describes various non-volatile memory (NVM) intellectual property (IP) alternatives with specific reference to their integration within system-on-chip designs targeting the 65nm process node and below. The article considers many of the strengths and vulnerabilities of these IP options, and then describes the tests that must be undertaken to ensure their long-term reliability, particularly [...]
But in a good way. As ITC moves to Anaheim’s Disneyland in September, we preview the 2011 edition.
Most memory module standards have not been specified with particular reference to extreme environments where shock and vibration may present significant risk. Rather, designers have had to use a number of workaround techniques, strapping or even directly soldering devices to the board. In addition, the drive toward smaller board sizes is presenting a number of [...]
This white paper describes the emergence of SoC FPGAs, the drivers behind their market, and proposes some strategic considerations for executive management and system designers when choosing these devices.
Poster sessions are all too often given Cinderella status at major conferences, but they often contain novel and interesting responses to current technology challenges. This article reviews five poster papers that were released at the 2010 International Test Conference ranging in topic from improved device interfaces for gigahertz test to IP security to the diagnosing [...]
View All Sponsors