place and route

May 31, 2011

The Roadmap to LFD Value: Quantifying a Return on Investment in Calibre LFD

By the time a serious lithographic problem is identified at the fab, it is too late in the design process to make a simple layout change, resulting in a significant delay of the tapeout, and consequently chip delivery. To diminish the risk of sensitive layout structures, and avoid or reduce design delays, designers need the […]

Whitepaper  |  Topics: EDA - DFM  |  Tags: , , ,

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