IP

March 15, 2017
DVCon China takes place at the Parkyard Hotel, Shanghai on April 19th.

DVCon China launches this April in Shanghai

DVCon China general chair Andy Liu discusses Accellera’s new addition to its design and verification conference series (简体中文).
Expert Insight  |  Topics: EDA - ESL, IC Implementation, Verification  |  Tags: , , , , , , ,   |  Organizations: , , ,
March 15, 2017
DVCon China takes place at the Parkyard Hotel, Shanghai on April 19th.

DVCon中国将于4月在上海亮相

DVCon中国大会主席刘红亮讨论了Accellera新增的DVCon中国ASIC设计和验证会议的看点。
Article  |  Topics: Uncategorized  |  Tags: , , , , , , ,   |  Organizations: , , ,
February 18, 2016
RTL Floorplanning - Featured Image

How new RTL floorplanning techniques speed physical design

Advances in RTL floorplanning help cut front-to-back-end iterations, speed synthesis by 10X and boast the capacity needed for today's designs.
January 30, 2015

Mixed-signal verification of advanced SoCs using VCS AMS

How ST Microelectronics uses Synopsys' VCS AMS, combining VCS functional verification and CustomSim, to verify one of its mixed-signal designs
Article  |  Topics: IP Topics, EDA - Verification  |  Tags: , , , , ,   |  Organizations: ,
May 8, 2013
Segement from PCB design rule schematic

Keeping high-speed designs clean with ERC

Electrical rule checks (ERC) are now available to deal with increasing PCB design complexity, speed project delivery and protect the intellectual property within them.
April 24, 2013
Mick Posner, Director of Product Marketing for Synopsys' FPGA-Based Prototyping Solutions.

IP-to-SoC prototyping demands consistency

Many problems arise during the IP-to-SoC phase of FPGA-based prototyping due to the mix-and-match nature of the prototypes not the actual designs.
Expert Insight  |  Topics: IP - Assembly & Integration, - EDA Topics, IP Topics, EDA - Verification  |  Tags: , ,   |  Organizations: ,
November 16, 2012
Stephen Pateras

IJTAG: delivering an industry platform for IP test and integration

Mentor's Stephen Pateras explains how the proposed IJTAG standard speeds IP test by replacing time-consuming custom and ad hoc methodologies.
Expert Insight  |  Topics: IP - Assembly & Integration, EDA - DFT  |  Tags: , ,   |  Organizations: ,
June 1, 2011

The new semiconductor ecosystem: wants and needs

Leading chip design analyst Gary Smith charts the course through the main questions dominating DAC 2011.
Article  |  Topics: EDA - ESL, IC Implementation  |  Tags: , ,   |  Organizations:
February 25, 2011

Planning reset strategies: flow and functionality in OVM verification components

The article describes a methodology and appropriate code for developing a reset strategy that will work within a verification process. Specifically, the proposal has been drafted within the terms of the Open Verification Methodology.
Article  |  Topics: EDA - Verification  |  Tags: ,
February 25, 2011

OVM testbench API for accelerating coverage closure

Constrained random testbenches excel at quickly hitting the majority of coverage but their effectiveness trails off as coverage closure nears completion. This paper describes a testbench API that sits on top of OVM sequences allowing the existing constrained random infrastructure to be guided, enabling faster, more efficient coverage closure. Design and verification engineers can use [...]
Article  |  Topics: EDA - Verification  |  Tags: , , ,

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