IC reliability

April 17, 2018
Guido Groeseneken is an Imec fellow, researching advanced devices and the reliability physics of sub-10nm CMOS technologies.

Reliability research helps to create new technologies

Insights from research into reliability at Imec led to self-learning chips, security technologies, and finFET biosensors.
Expert Insight  |  Topics: EDA - DFM  |  Tags: , , , , ,   |  Organizations:
September 14, 2012

Moving to advanced reliability verification

Shrinking process nodes, rising power efficiency goals and burgeoning device functionality are stretching existing DFR techniques to their limits. This scalable methodology looks to address the shortfall.
Article  |  Topics: EDA - Verification  |  Tags: ,   |  Organizations: ,
May 1, 2010

Extending critical area analysis to address design for reliability

The time-dependent dielectric breakdown (TDDB) of inter-metal dielectrics on large-scale chips is becoming an increasingly important reliability issue across several semiconductor markets. This mechanism can cause early failures in use and is difficult to detect by traditional test, and hard to control by traditional reliability techniques.
Article  |  Topics: EDA - DFM  |  Tags: , ,

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