failure analysis

April 17, 2018
Guido Groeseneken is an Imec fellow, researching advanced devices and the reliability physics of sub-10nm CMOS technologies.

Reliability research helps to create new technologies

Insights from research into reliability at Imec led to self-learning chips, security technologies, and finFET biosensors.
Expert Insight  |  Topics: EDA - DFM  |  Tags: , , , , ,   |  Organizations:
March 19, 2012

RTL debug: integrating automation and vizualization

Root-cause analysis of detected errors is a key design step. Debugging can take more than half of the verification effort. Vennsa’s OnPoint automated debug technology has been integrated with Springsoft’s Verdi visualization platform to reduce cost and uncertainty.
Article  |  Topics: EDA - Verification  |  Tags: ,

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