double pattering

December 31, 2018
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Enhanced model-based hinting may be the edge you need below 20nm

A detailed dive into how MBH strategies for litho hotspots have been enhanced to deal with double patterning at 20nm and below.
Article  |  Topics: EDA - DFM  |  Tags: , , , , , ,   |  Organizations: , , , ,
November 24, 2017
John Ferguson is the Director of Marketing for Calibre DRC Applications at Mentor, a Siemens Business, in Wilsonville, Oregon, with extensive experience in physical design verification. He holds a BS degree in Physics from McGill University, an MS in Applied Physics from the University of Massachusetts, and a PhD in Electrical Engineering from the Oregon Graduate Institute of Science and Technology.

Assessing the true cost of node transitions

John Ferguson reviews the key capital metrics you need to review when deciding whether to move to a new process.
Expert Insight  |  Topics: EDA - DFM, IC Implementation, Verification  |  Tags: , , , , , , , , ,   |  Organizations: , , , , ,

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