NXP Semiconductors

September 21, 2017
Diagnosis-driven yield analysis featured image

Yield is money – and other truths of diagnosis-driven yield analysis

Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed the ramp-to-volume on new processes and improve yield on mature ones.
May 15, 2017
Dr Walden Rhines is Chairman and CEO of Mentor - A Siemens Business

The Wally Rhines interview – Part Two: AI, automotive and security

This second part looks at Mentor's views on flow neutrality, how DRS360 was born, machine learning and the threat from embedded Trojans.
August 28, 2016
Chips on a wafer

Addressing the verification challenges of complex SoCs

Three senior verification specialists talk about how they are navigating the challenge of verifying multibillion-transistor SoCs with limited compute resource, increasing coverage demands and shrinking timescales.
May 23, 2016
Road signs used to train IDSIA neural network

Bit width tweaks point way to practical deep learning

In both data centers and automobiles deep learning is taking hold. But it is a technique that challenges conventional microprocessors, leading system designers to look at alternative architectures for acceleration.
March 1, 2009

Rapid design flows for advanced technology pathfinding

The paper describes several innovative modifications to standard design flows that enable new device technologies to be rapidly assessed at the system level. Cell libraries from these rapid flows are employed by a design flow description language (PSYCHIC) for the exploration of highly speculative ‘what if’ scenarios. These rapid design flows are used to explore […]

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