John Sturtevant looks at ongoing preparations for the incoming node and charts significant progress that has already been made.
Precise curved geometries are vital to making this emerging and cost-effective CMOS-based technology work. This primer explains its advantages and how litho tools are evolving to meet the challenges it presents.
Combining assertion-based verification techniques with emulation makes for easier debug, better coverage and greater functional efficiency.
Need to convince your FD of emulation’s growing ROI and the need to invest? Click here and ‘Forward’
Fab and IP vendor collaboration is making pattern matching-based libraries a vital component of DRC accuracy and efficiency. Learn how to take advantage.
This 'how to' guide shows how to combine the power of emerging and existing technologies for faster, more comprehensive test.
Innovation in physical verification is driven by incoming nodes but new tools and features can and should be fed back up the technology chain.
Sign-off lithography verification is vital as we move beyond double to multi-patterning but changing responsibilities in the flow must be handed with care.
We look at how best to leverage both software debug tools and emulators, the limitations to traditional techniques, and the drive toward offline debug.
Complexity and the increasing use of thermal analysis software by non-expert designers demands new approaches for chip and PCB implementations.
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