Samsung bases PRISM and FLARE defect analysis and optimization on Mentor Graphics' Calibre and Tessent. Yields rise. Ramps shorten.
Spice regressions, library characterisation and yield analysis are all being promoted as suitable for running on the cloud
The Silicon Integration Initiative (Si2) is targeting the end of the year for release 2.0 of its OpenDFM standard, which will include support for DRC+ and make it possible to build search engines for yield.
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