Samsung bases PRISM and FLARE defect analysis and optimization on Mentor Graphics' Calibre and Tessent. Yields rise. Ramps shorten.
Companies such as Broadcom are experiencing threefold test-pattern reductions through the use of automatically inserted gates that allow parallel cones to share the same ATPG patterns that would not be possible using conventional test generation schemes.
UK-based RAL Space has picked up an award from National Instruments for a system the organization built to test a pair of cameras ahead of being being deployed on the International Space Station to photograph the Earth from orbit.
National Instruments plans to build an ecosystem around semiconductor test that could provide a missing link between the design process and production.
Jasper Design Automation has developed a tool that analyzes RTL and gate-level HDL for hidden paths that may expose on-chip secure elements to hackers.
Packed one-day event has speakers from Cadence, TSMC, Samsung, Amkor, Advantest and more providing a senior level view of making 3D-IC a reality. Registration closes soon.
Real Intent and DeFacTo Technologies combine clock-domain crossing and design for test tools in RTL sign-off flow.
Mentor's Stephen Pateras explains how the proposed IJTAG standard speeds IP test by replacing time-consuming custom and ad hoc methodologies.
The International Symposium on Quality Electronic Design (ISQED) enters its 13th edition later this month, running March 19-21 at Techmart in Santa Clara. Although ISQED traditionally concentrated on tools and IP blocks, its agenda has broadened as the industry has migrated to SoCs and full electronic systems where process and manufacturing interactions have come to […]